yoon2011vecc
Summary
Doe Hyun Yoon, and Mattan Erez. Virtualized ECC: Flexible Reliability in Main Memory. IEEE Micro, 31(1):11–19, 2011.
Bibtex entry
@ARTICLE { yoon2011vecc,
AUTHOR = { Doe Hyun Yoon and Mattan Erez },
TITLE = { Virtualized ECC: Flexible Reliability in Main Memory },
JOURNAL = { IEEE Micro },
VOLUME = { 31 },
NUMBER = { 1 },
ISSN = { 0272–1732 },
YEAR = { 2011 },
PAGES = { 11-−19 },
DOI = { 10.1109/MM.2010.103 },
PUBLISHER = { IEEE Computer Society },
ADDRESS = { Los Alamitos, CA },
MYCAT = { journal },
}