Defect Tolerance on the Teramac Custom Computer
Scribe: Song Zhang
Problems
Chips have low yield due to manufacture defects, so need to tolerate defects, such as work around defects, to achieve lower cost.
Manufacture Defects
- Dust on wafer
- Cause false mask, and may cause short wires.
- As technology scales, smaller dusts can cause manufacture defects.
- Using clean room may help, but could not avoid this defects.
- Etching
- Old etching techniques may cause uneven surface.
- Control Issue
Manufacture Variants
- Wavelength of lights
- Wavelength of lights and sizes of transistors are in same scale, which may cause light diffraction when printing.
- Use liquids to shorten the wavelengths of lights may ease this problem.
- Variances across wafer
- As technology scales down, variances across wafer goes higher. This means, some chips may be faster than other chips.
Previous Techniques to Tolerate Variances
Focus more on inter-die variances than intra-die variances
- Set frequency of chips to lowest frequency
- This may cause performance degradation.
- Sell low frequency or less functionality chips with low prices
- Some companies may intentionally do so for low-end users.
- This technique will increase yield ratio.
Teramac
Tolerate defects without redundancy
- Defects Detection
- Test good sets of gates
- How?
- Let gates produce pseudo-random numbers
- Missing parts in this test:
- NOT consider variations of gates.
- NOT test all latches in every gate (only for configurations associated with pseudo-random number generation).
- How?
- Test slow gates
- Some resources may produce logically correct results but slow. This will fail some user design at expected frequency.
- Still not good coverage, but good enough for what they did.
- Tests
- Tests are important
- At least partially test the wafer before packaging, maybe through probing, because packaging is expensive.
- Tests need to be fast, otherwise will wait long time on testing large amount of wafers.
- Trade off between time to market and cost of test equipment. May need special circuits for testing
- Test will be harder if taking “aging” into consideration.
- Tests are important
- Previous Work
- Use spare resources to replace defective resources in a fine-grained manner.
- NOT fine-graine for defective memory cells, whose granularity is whole row or column.
- Test good sets of gates
- After Defects Detection
- Build databases of defective resources
- Using ample hierarchical interconnect to dynamically map applications onto “good” resources
- Rent’s Rule
- Power law between # of pins and # of components in a block.
- # of external signal = {$ \sqrt{\#\ of\ logic\ gates} $} is a good approximation.
- Hierarchical interconnection limits # of wires in high level.
- Rent’s Rule
Users
Users who use FPGA platform:
- Use it as a prototype to test designs.
- This is one of Teramac’s targets.
- Another one is to use parallelism in FPGA to do fast gate-level simulation.
- Use it as a replacement of low volume/expensive ASIC.
Results
- Half price (kind of cheat it)
- For each perfect chip, they can get one imperfect chip for free.
- Still need good parts, because control aspects need to work.
- Mapping software
Evaluations
- How was Teramac evaluated?
- Build a chip with large number of defects.
- Matching Goal?
- Goal is to have circuits simulation done in low cost (half-chip for free)
- NOT included defects detection cost and interconnect redundancy cost.
- NOT included costs of ample interconnection and routing.
- Add lots of wires, which are expensive.
- NOT included costs for manufacture and packaging.
- Manufacture a multi-chip module is expensive.
- Twice as many layers as manufacture recommended.
- Manufacture a multi-chip module is expensive.
- NOT included aging.
- To be fair, aging is not a problem back then.
- NOT proved they save money with Teramac.
Application on today
- NOT worthy to build Teramac today, because cost of wire/transistor is too high.
- Cannot afford so redundant interconnections.
